TEST_NAME : Wafer
TEST_DATE : 24_08_27-22_46_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-018-019-01 | FUSED_ID : 6359364768387637553
  IC_TEMP :  -56.27 | VDDM : 1125.14 | AUX_INT :  -52.30 | CsaBias :   42.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.12801e-03 / 2
  ADC_P0  : -5.22965e-02 ± 2.47391e-02
  ADC_P1  : 8.71058e-03 ± 5.70907e-04
  ADC_P2  : -7.71321e-06 ± 2.59990e-06
  CSA_Chi2/NDF : 1.34983e-04 / 2
  CSA_P0  : 5.78058e-02 ± 7.74928e-03
  CSA_P1  : 9.96394e-03 ± 5.83852e-04
  CSA_P2  : -4.46174e-05 ± 8.89138e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [7, 8, 55, 57, 76, 102, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [38, 81, 110, 111, 113, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2303', '1.800', '0.1418', '1.800', '0.0817', '7.000', '0.7065', 1, 1, 1, 1, 1724791562.085033]
VI_after__Init : ['1.201', '0.2301', '1.800', '0.1413', '1.800', '0.0762', '7.000', '0.7063', 1, 1, 1, 1, 1724791570.9312804]
VI_at__the_End : ['1.201', '0.5038', '1.800', '0.1355', '1.799', '0.1111', '7.000', '0.7072', 1, 1, 1, 1, 1724791630.9257216]