TEST_NAME : Wafer
TEST_DATE : 24_08_28-21_24_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-007-019-14 | FUSED_ID : 6359364768388641086
  IC_TEMP :  -57.19 | VDDM : 1128.34 | AUX_INT :   -7.93 | CsaBias :   71.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09648e-03 / 2
  ADC_P0  : -7.93190e-03 ± 2.24334e-02
  ADC_P1  : 8.82899e-03 ± 5.84756e-04
  ADC_P2  : -6.17484e-06 ± 3.02368e-06
  CSA_Chi2/NDF : 1.25796e-04 / 2
  CSA_P0  : 5.99977e-02 ± 7.48093e-03
  CSA_P1  : 9.95198e-03 ± 5.63634e-04
  CSA_P2  : -5.00667e-05 ± 8.58348e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [59, 69, 90]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [11, 20, 31, 33, 101, 110, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1730', '1.800', '0.1479', '1.800', '0.0836', '7.000', '0.7072', 1, 1, 1, 1, 1724873096.8024802]
VI_after__Init : ['1.202', '0.1731', '1.800', '0.1479', '1.800', '0.0778', '7.000', '0.7072', 1, 1, 1, 1, 1724873104.9209049]
VI_at__the_End : ['1.201', '0.4832', '1.800', '0.1374', '1.799', '0.1142', '7.000', '0.7079', 1, 1, 1, 1, 1724873168.5299141]