TEST_NAME : Wafer
TEST_DATE : 24_08_29-09_22_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-005-022-07 | FUSED_ID : 6359364768389681511
  IC_TEMP :  -59.82 | VDDM : 1127.45 | AUX_INT :   -6.71 | CsaBias :   61.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.69848e-04 / 2
  ADC_P0  : -6.70665e-03 ± 1.99451e-02
  ADC_P1  : 8.59551e-03 ± 5.03588e-04
  ADC_P2  : -6.29912e-06 ± 2.50809e-06
  CSA_Chi2/NDF : 1.46720e-04 / 2
  CSA_P0  : 5.85150e-02 ± 8.07917e-03
  CSA_P1  : 9.67150e-03 ± 6.08707e-04
  CSA_P2  : -4.79601e-05 ± 9.26989e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [93, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [0, 10, 14, 24, 32, 40, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3558', '1.799', '0.1646', '1.799', '0.0899', '7.000', '0.7069', 1, 1, 1, 1, 1724916120.2765274]
VI_after__Init : ['1.201', '0.3554', '1.800', '0.1643', '1.800', '0.0847', '7.000', '0.7068', 1, 1, 1, 1, 1724916128.4698622]
VI_at__the_End : ['1.201', '0.4752', '1.800', '0.1386', '1.806', '0.1125', '7.000', '0.7075', 1, 1, 1, 1, 1724916189.4431047]