TEST_NAME : Wafer
TEST_DATE : 24_08_29-10_45_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-007-017-04 | FUSED_ID : 6359364768389689620
  IC_TEMP :  -51.47 | VDDM : 1130.12 | AUX_INT :   -7.55 | CsaBias :   65.72
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05407e-03 / 2
  ADC_P0  : -7.55398e-03 ± 2.19680e-02
  ADC_P1  : 8.19333e-03 ± 5.25990e-04
  ADC_P2  : -5.77269e-06 ± 2.48920e-06
  CSA_Chi2/NDF : 7.38652e-05 / 2
  CSA_P0  : 5.81672e-02 ± 5.73248e-03
  CSA_P1  : 9.34264e-03 ± 4.31901e-04
  CSA_P2  : -4.06216e-05 ± 6.57734e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [1, 25, 34, 36, 43, 60, 62, 63, 80, 102]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [44, 59, 60, 61, 68, 75, 85, 96]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3360', '1.800', '0.1126', '1.800', '0.0905', '7.000', '0.7077', 1, 1, 1, 1, 1724921105.9951684]
VI_after__Init : ['1.201', '0.3362', '1.800', '0.1126', '1.800', '0.0846', '7.000', '0.7076', 1, 1, 1, 1, 1724921114.1315126]
VI_at__the_End : ['1.201', '0.4825', '1.800', '0.1331', '1.800', '0.1118', '7.000', '0.7085', 1, 1, 1, 1, 1724921181.0603166]