TEST_NAME : Wafer
TEST_DATE : 24_08_29-16_36_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-016-011-07 | FUSED_ID : 6359364768389726391
  IC_TEMP :  -48.28 | VDDM : 1130.47 | AUX_INT :   -6.51 | CsaBias :   75.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.48708e-04 / 2
  ADC_P0  : -6.51355e-03 ± 2.08860e-02
  ADC_P1  : 8.23369e-03 ± 5.17545e-04
  ADC_P2  : -4.95730e-06 ± 2.53548e-06
  CSA_Chi2/NDF : 9.03568e-05 / 2
  CSA_P0  : 6.13031e-02 ± 6.34020e-03
  CSA_P1  : 9.47796e-03 ± 4.77688e-04
  CSA_P2  : -3.90455e-05 ± 7.27463e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [10, 98, 100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [17, 28, 37, 57, 83, 97, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3011', '1.800', '0.1391', '1.800', '0.0904', '7.000', '0.7067', 1, 1, 1, 1, 1724942218.8630028]
VI_after__Init : ['1.201', '0.3011', '1.800', '0.1389', '1.800', '0.0845', '7.000', '0.7069', 1, 1, 1, 1, 1724942226.9403448]
VI_at__the_End : ['1.201', '0.5001', '1.800', '0.1399', '1.800', '0.1093', '7.000', '0.7076', 1, 1, 1, 1, 1724942291.7732885]