TEST_NAME : Wafer
TEST_DATE : 24_08_29-16_38_35
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-016-012-07 | FUSED_ID : 6359364768389726407
  IC_TEMP :  -48.28 | VDDM : 1130.76 | AUX_INT :   -8.65 | CsaBias :   81.35
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25228e-03 / 2
  ADC_P0  : -8.65499e-03 ± 2.39771e-02
  ADC_P1  : 8.24236e-03 ± 5.79680e-04
  ADC_P2  : -5.47761e-06 ± 2.78610e-06
  CSA_Chi2/NDF : 1.24666e-04 / 2
  CSA_P0  : 5.82537e-02 ± 7.44727e-03
  CSA_P1  : 9.78279e-03 ± 5.61098e-04
  CSA_P2  : -4.22126e-05 ± 8.54485e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [5, 68, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [0, 15, 78, 81, 87, 91, 93, 101]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3366', '1.800', '0.1780', '1.800', '0.0880', '7.000', '0.7071', 1, 1, 1, 1, 1724942314.7485914]
VI_after__Init : ['1.201', '0.3369', '1.800', '0.1780', '1.799', '0.0825', '7.000', '0.7069', 1, 1, 1, 1, 1724942322.7499943]
VI_at__the_End : ['1.202', '0.5055', '1.800', '0.1394', '1.800', '0.1097', '7.000', '0.7076', 1, 1, 1, 1, 1724942389.5398355]