TEST_NAME : Wafer
TEST_DATE : 24_08_29-17_25_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-018-010-04 | FUSED_ID : 6359364768389734564
  IC_TEMP :  -44.84 | VDDM : 1132.42 | AUX_INT :  -81.29 | CsaBias :   31.30
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.82398e-04 / 2
  ADC_P0  : -8.12946e-02 ± 2.48025e-02
  ADC_P1  : 9.48718e-03 ± 6.14552e-04
  ADC_P2  : -8.69200e-06 ± 2.98358e-06
  CSA_Chi2/NDF : 9.62378e-05 / 2
  CSA_P0  : 6.13149e-02 ± 6.54328e-03
  CSA_P1  : 9.76894e-03 ± 4.92989e-04
  CSA_P2  : -4.09950e-05 ± 7.50763e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [13, 38, 63, 64, 96]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [2, 26, 58, 62, 75, 79, 82, 87, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4700', '1.800', '0.1165', '1.800', '0.0883', '7.000', '0.7068', 1, 1, 1, 1, 1724945105.5471435]
VI_after__Init : ['1.201', '0.4690', '1.800', '0.1165', '1.800', '0.0824', '7.000', '0.7065', 1, 1, 1, 1, 1724945114.2593153]
VI_at__the_End : ['1.201', '0.5107', '1.800', '0.1394', '1.800', '0.1086', '7.000', '0.7074', 1, 1, 1, 1, 1724945181.724427]