TEST_NAME : Wafer
TEST_DATE : 24_08_30-08_05_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-002-010-00 | FUSED_ID : 6359364768390717600
  IC_TEMP : -137.07 | VDDM : 1129.34 | AUX_INT :  -40.29 | CsaBias :   20.47
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 6.64929e-03 / 2
  ADC_P0  : -4.02934e-02 ± 5.79415e-02
  ADC_P1  : 1.01856e-02 ± 1.56457e-03
  ADC_P2  : -9.59634e-06 ± 8.60715e-06
  CSA_Chi2/NDF : 6.26948e-05 / 2
  CSA_P0  : 6.05829e-02 ± 5.28127e-03
  CSA_P1  : 1.06585e-02 ± 3.97905e-04
  CSA_P2  : -8.87886e-05 ± 6.05963e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  
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VI_before_Init : ['1.201', '0.1883', '1.800', '0.1105', '1.799', '0.1010', '7.000', '0.7076', 1, 1, 1, 1, 1724997945.6816392]
VI_after__Init : ['1.201', '0.1892', '1.800', '0.1111', '1.800', '0.0950', '7.000', '0.7073', 1, 1, 1, 1, 1724997954.4389188]
VI_at__the_End : ['1.201', '0.3800', '1.800', '0.1272', '1.805', '0.1383', '7.000', '0.7084', 1, 1, 1, 1, 1724998019.8339226]