TEST_NAME : Wafer
TEST_DATE : 24_08_30-08_10_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-002-012-00 | FUSED_ID : 6359364768390717632
  IC_TEMP : -135.32 | VDDM : 1122.17 | AUX_INT :  -14.29 | CsaBias :   36.29
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.73994e-03 / 2
  ADC_P0  : -1.42902e-02 ± 3.53914e-02
  ADC_P1  : 1.01685e-02 ± 9.82530e-04
  ADC_P2  : -1.05328e-05 ± 5.47429e-06
  CSA_Chi2/NDF : 7.03901e-05 / 2
  CSA_P0  : 5.91580e-02 ± 5.59601e-03
  CSA_P1  : 1.02505e-02 ± 4.21619e-04
  CSA_P2  : -8.49485e-05 ± 6.42075e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [11, 20, 62, 64, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [22, 33, 55, 66, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2237', '1.800', '0.1464', '1.800', '0.1027', '7.000', '0.7074', 1, 1, 1, 1, 1724998229.7912207]
VI_after__Init : ['1.201', '0.2247', '1.800', '0.1472', '1.800', '0.0969', '7.000', '0.7074', 1, 1, 1, 1, 1724998237.8845153]
VI_at__the_End : ['1.201', '0.3695', '1.800', '0.1254', '1.801', '0.1383', '7.000', '0.7079', 1, 1, 1, 1, 1724998296.5198438]