TEST_NAME : Wafer
TEST_DATE : 24_08_30-08_18_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-002-017-07 | FUSED_ID : 6359364768390717719
  IC_TEMP : -128.12 | VDDM : 1111.83 | AUX_INT :  -13.04 | CsaBias :   34.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.36583e-03 / 2
  ADC_P0  : -1.30368e-02 ± 3.29186e-02
  ADC_P1  : 9.63095e-03 ± 8.83570e-04
  ADC_P2  : -8.82195e-06 ± 4.75568e-06
  CSA_Chi2/NDF : 5.21833e-05 / 2
  CSA_P0  : 6.03566e-02 ± 4.81824e-03
  CSA_P1  : 1.05135e-02 ± 3.63019e-04
  CSA_P2  : -8.54013e-05 ± 5.52836e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [3, 64, 84, 115, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [15, 18, 42, 69, 75, 84, 111, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3295', '1.800', '0.1275', '1.799', '0.1050', '7.000', '0.7071', 1, 1, 1, 1, 1724998709.7435353]
VI_after__Init : ['1.202', '0.3346', '1.800', '0.1284', '1.799', '0.0995', '7.000', '0.7070', 1, 1, 1, 1, 1724998717.0357947]
VI_at__the_End : ['1.186', '0.3837', '1.800', '0.1278', '1.800', '0.1371', '7.000', '0.7079', 1, 1, 1, 1, 1724998785.8935108]