TEST_NAME : Wafer
TEST_DATE : 24_08_30-08_44_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-003-009-13 | FUSED_ID : 6359364768390721693
  IC_TEMP : -107.77 | VDDM : 1116.57 | AUX_INT :  -12.14 | CsaBias :   35.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.15392e-03 / 2
  ADC_P0  : -1.21358e-02 ± 3.14246e-02
  ADC_P1  : 9.58084e-03 ± 8.45687e-04
  ADC_P2  : -8.63902e-06 ± 4.54823e-06
  CSA_Chi2/NDF : 1.10917e-04 / 2
  CSA_P0  : 5.75434e-02 ± 7.02458e-03
  CSA_P1  : 1.07328e-02 ± 5.29252e-04
  CSA_P2  : -7.93900e-05 ± 8.05988e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [5, 17, 68, 98, 108, 111, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [8, 73, 94, 117, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2764', '1.800', '0.1606', '1.799', '0.1124', '7.000', '0.7073', 1, 1, 1, 1, 1725000248.4040084]
VI_after__Init : ['1.202', '0.2771', '1.800', '0.1617', '1.801', '0.1068', '7.000', '0.7075', 1, 1, 1, 1, 1725000256.5843666]
VI_at__the_End : ['1.201', '0.4153', '1.800', '0.1297', '1.802', '0.1337', '7.000', '0.7083', 1, 1, 1, 1, 1725000319.2285013]