TEST_NAME : Wafer
TEST_DATE : 24_08_30-08_42_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-003-010-13 | FUSED_ID : 6359364768390721709
  IC_TEMP : -115.11 | VDDM : 1128.24 | AUX_INT :  -11.43 | CsaBias :   36.71
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.87154e-03 / 2
  ADC_P0  : -1.14309e-02 ± 2.92891e-02
  ADC_P1  : 9.66901e-03 ± 8.06159e-04
  ADC_P2  : -8.27130e-06 ± 4.43949e-06
  CSA_Chi2/NDF : 7.94054e-05 / 2
  CSA_P0  : 5.80336e-02 ± 5.94357e-03
  CSA_P1  : 1.09688e-02 ± 4.47805e-04
  CSA_P2  : -8.71577e-05 ± 6.81954e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [3, 23, 48, 67, 89, 101, 112, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [16, 40, 87, 100, 108, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3786', '1.800', '0.1391', '1.800', '0.1046', '7.000', '0.7074', 1, 1, 1, 1, 1725000151.7715964]
VI_after__Init : ['1.201', '0.3817', '1.800', '0.1398', '1.799', '0.0985', '7.000', '0.7071', 1, 1, 1, 1, 1725000159.882922]
VI_at__the_End : ['1.202', '0.4007', '1.800', '0.1299', '1.801', '0.1364', '7.000', '0.7084', 1, 1, 1, 1, 1725000221.2361155]