TEST_NAME : Wafer
TEST_DATE : 24_08_30-08_40_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-003-011-13 | FUSED_ID : 6359364768390721725
  IC_TEMP :  -95.64 | VDDM : 1116.13 | AUX_INT :  -90.13 | CsaBias :  -28.97
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 5.42539e-03 / 2
  ADC_P0  : -9.01304e-02 ± 5.75388e-02
  ADC_P1  : 1.02597e-02 ± 1.43407e-03
  ADC_P2  : -1.10048e-05 ± 7.21479e-06
  CSA_Chi2/NDF : 1.24497e-04 / 2
  CSA_P0  : 5.87070e-02 ± 7.44222e-03
  CSA_P1  : 1.01430e-02 ± 5.60718e-04
  CSA_P2  : -7.15965e-05 ± 8.53907e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [18, 24, 48, 76, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [6, 7, 24, 30, 52, 64, 85, 112, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3147', '1.800', '0.1324', '1.800', '0.1026', '7.000', '0.7075', 1, 1, 1, 1, 1725000055.067173]
VI_after__Init : ['1.202', '0.3160', '1.800', '0.1331', '1.801', '0.0968', '7.000', '0.7072', 1, 1, 1, 1, 1725000063.2025175]
VI_at__the_End : ['1.202', '0.4102', '1.800', '0.1270', '1.799', '0.1331', '7.000', '0.7080', 1, 1, 1, 1, 1725000128.3274262]