TEST_NAME : Wafer
TEST_DATE : 24_08_30-08_37_43
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-003-013-13 | FUSED_ID : 6359364768390721757
  IC_TEMP : -101.97 | VDDM : 1112.98 | AUX_INT :  -11.57 | CsaBias :   34.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.95649e-03 / 2
  ADC_P0  : -1.15725e-02 ± 2.99524e-02
  ADC_P1  : 9.16592e-03 ± 7.75588e-04
  ADC_P2  : -7.73845e-06 ± 4.01316e-06
  CSA_Chi2/NDF : 9.49250e-05 / 2
  CSA_P0  : 5.85239e-02 ± 6.49849e-03
  CSA_P1  : 1.03506e-02 ± 4.89615e-04
  CSA_P2  : -7.49467e-05 ± 7.45625e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [49, 54, 72, 95, 101, 107, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [19, 59, 78, 79, 104, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3623', '1.800', '0.1304', '1.800', '0.1086', '7.000', '0.7075', 1, 1, 1, 1, 1724999862.7410126]
VI_after__Init : ['1.202', '0.3654', '1.800', '0.1316', '1.800', '0.1021', '7.000', '0.7069', 1, 1, 1, 1, 1724999870.9232752]
VI_at__the_End : ['1.202', '0.4095', '1.800', '0.1277', '1.803', '0.1336', '7.000', '0.7080', 1, 1, 1, 1, 1724999934.4903622]