TEST_NAME : Wafer
TEST_DATE : 24_08_30-08_31_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-003-017-10 | FUSED_ID : 6359364768390721818
  IC_TEMP : -127.67 | VDDM : 1140.02 | AUX_INT :  -15.00 | CsaBias :   35.07
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 3.05857e-03 / 2
  ADC_P0  : -1.49952e-02 ± 3.73975e-02
  ADC_P1  : 1.00661e-02 ± 1.01518e-03
  ADC_P2  : -1.07948e-05 ± 5.52232e-06
  CSA_Chi2/NDF : 5.33932e-05 / 2
  CSA_P0  : 6.01409e-02 ± 4.87377e-03
  CSA_P1  : 1.01885e-02 ± 3.67204e-04
  CSA_P2  : -7.93815e-05 ± 5.59208e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [40, 41, 47, 95, 96, 104, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [42, 44, 46, 49, 55, 95, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2075', '1.800', '0.1278', '1.799', '0.1000', '7.000', '0.7067', 1, 1, 1, 1, 1724999477.758841]
VI_after__Init : ['1.201', '0.2081', '1.800', '0.1282', '1.801', '0.0941', '7.000', '0.7065', 1, 1, 1, 1, 1724999485.821194]
VI_at__the_End : ['1.202', '0.3879', '1.800', '0.1265', '1.809', '0.1372', '7.000', '0.7077', 1, 1, 1, 1, 1724999548.9063268]