TEST_NAME : Wafer
TEST_DATE : 24_08_30-08_28_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-003-019-10 | FUSED_ID : 6359364768390721850
  IC_TEMP : -112.31 | VDDM : 1121.30 | AUX_INT :  -12.54 | CsaBias :   35.23
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.10162e-03 / 2
  ADC_P0  : -1.25371e-02 ± 3.09636e-02
  ADC_P1  : 9.59913e-03 ± 8.20227e-04
  ADC_P2  : -9.27997e-06 ± 4.34275e-06
  CSA_Chi2/NDF : 8.45779e-05 / 2
  CSA_P0  : 5.88485e-02 ± 6.13410e-03
  CSA_P1  : 1.07353e-02 ± 4.62160e-04
  CSA_P2  : -8.21072e-05 ± 7.03815e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [0, 40, 69, 115, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [8, 39, 40, 85, 91, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3716', '1.800', '0.1492', '1.799', '0.1027', '7.000', '0.7069', 1, 1, 1, 1, 1724999286.3436747]
VI_after__Init : ['1.201', '0.3802', '1.800', '0.1511', '1.800', '0.0975', '7.000', '0.7067', 1, 1, 1, 1, 1724999294.507014]
VI_at__the_End : ['1.201', '0.4069', '1.800', '0.1291', '1.808', '0.1352', '7.000', '0.7077', 1, 1, 1, 1, 1724999355.9922125]