TEST_NAME : Wafer
TEST_DATE : 24_08_30-08_48_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-004-006-05 | FUSED_ID : 6359364768390725733
  IC_TEMP : -108.57 | VDDM : 1129.20 | AUX_INT :   -9.23 | CsaBias :   46.34
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.44841e-03 / 2
  ADC_P0  : -9.22613e-03 ± 2.58120e-02
  ADC_P1  : 9.30169e-03 ± 7.04595e-04
  ADC_P2  : -6.84476e-06 ± 3.83017e-06
  CSA_Chi2/NDF : 9.87432e-05 / 2
  CSA_P0  : 5.93848e-02 ± 6.62790e-03
  CSA_P1  : 1.02953e-02 ± 4.99364e-04
  CSA_P2  : -7.52112e-05 ± 7.60473e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [22, 85, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [14, 47, 63, 86]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1669', '1.800', '0.1130', '1.800', '0.1029', '7.000', '0.7076', 1, 1, 1, 1, 1725000536.9944692]
VI_after__Init : ['1.202', '0.1670', '1.800', '0.1130', '1.799', '0.0967', '7.000', '0.7077', 1, 1, 1, 1, 1725000545.231741]
VI_at__the_End : ['1.202', '0.4069', '1.800', '0.1289', '1.799', '0.1367', '7.000', '0.7084', 1, 1, 1, 1, 1725000604.0062046]