TEST_NAME : Wafer
TEST_DATE : 24_08_30-08_50_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-004-007-05 | FUSED_ID : 6359364768390725749
  IC_TEMP : -117.25 | VDDM : 1128.45 | AUX_INT :  -14.55 | CsaBias :   52.23
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.87819e-03 / 2
  ADC_P0  : -1.45479e-02 ± 3.62831e-02
  ADC_P1  : 9.60707e-03 ± 9.47303e-04
  ADC_P2  : -9.59780e-06 ± 4.95589e-06
  CSA_Chi2/NDF : 8.69902e-05 / 2
  CSA_P0  : 5.88278e-02 ± 6.22096e-03
  CSA_P1  : 1.06003e-02 ± 4.68705e-04
  CSA_P2  : -7.91991e-05 ± 7.13782e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [100]
 | N_BROKEN_SLOW :  [2, 18, 21, 46, 57, 62, 74, 77, 78, 82, 112]
   P_BROKEN_DISC :  67
 | P_BROKEN_FAST :  [61, 77, 89, 102]
 | P_BROKEN_SLOW :  [1, 2, 5, 6, 9, 10, 13, 14, 17, 18, 21, 22, 25, 26, 29, 30, 33, 34, 37, 38, 41, 42, 45, 46, 49, 50, 53, 54, 57, 58, 61, 62, 65, 66, 69, 70, 73, 77, 78, 81, 82, 85, 86, 89, 90, 93, 94, 97, 98, 101, 102, 105, 106, 109, 110, 113, 114, 117, 118, 121, 122, 125, 126]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2070', '1.800', '0.1472', '1.800', '0.0992', '7.000', '0.7076', 1, 1, 1, 1, 1725000633.0309374]
VI_after__Init : ['1.202', '0.2069', '1.800', '0.1475', '1.800', '0.0932', '7.000', '0.7076', 1, 1, 1, 1, 1725000641.8253617]
VI_at__the_End : ['1.202', '0.4101', '1.800', '0.1293', '1.799', '0.1359', '7.000', '0.7086', 1, 1, 1, 1, 1725000707.2651129]