TEST_NAME : Wafer
TEST_DATE : 24_08_30-08_53_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-004-009-05 | FUSED_ID : 6359364768390725781
  IC_TEMP :  -94.37 | VDDM : 1126.62 | AUX_INT :  -11.46 | CsaBias :   43.23
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.93154e-03 / 2
  ADC_P0  : -1.14558e-02 ± 2.97607e-02
  ADC_P1  : 9.15996e-03 ± 7.70626e-04
  ADC_P2  : -7.71973e-06 ± 3.98749e-06
  CSA_Chi2/NDF : 1.47712e-04 / 2
  CSA_P0  : 5.97698e-02 ± 8.10643e-03
  CSA_P1  : 1.10087e-02 ± 6.10761e-04
  CSA_P2  : -7.92832e-05 ± 9.30117e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [4, 5, 26, 32, 46, 52, 84, 86, 89, 94, 119, 120, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [6, 13, 36, 84, 88, 89, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2431', '1.800', '0.1317', '1.799', '0.0979', '7.000', '0.7077', 1, 1, 1, 1, 1725000826.108848]
VI_after__Init : ['1.202', '0.2430', '1.800', '0.1310', '1.800', '0.0919', '7.000', '0.7077', 1, 1, 1, 1, 1725000834.2252412]
VI_at__the_End : ['1.201', '0.4353', '1.800', '0.1321', '1.800', '0.1306', '7.000', '0.7083', 1, 1, 1, 1, 1725000895.4885101]