TEST_NAME : Wafer
TEST_DATE : 24_08_30-08_55_22
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-004-010-05 | FUSED_ID : 6359364768390725797
  IC_TEMP : -103.00 | VDDM : 1125.99 | AUX_INT :  -11.95 | CsaBias :   35.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.90416e-03 / 2
  ADC_P0  : -1.19527e-02 ± 2.94594e-02
  ADC_P1  : 9.49932e-03 ± 7.80030e-04
  ADC_P2  : -8.70931e-06 ± 4.13415e-06
  CSA_Chi2/NDF : 7.76990e-05 / 2
  CSA_P0  : 5.86822e-02 ± 5.87936e-03
  CSA_P1  : 1.05453e-02 ± 4.42967e-04
  CSA_P2  : -7.61567e-05 ± 6.74587e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [8, 25, 88, 101]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [29, 42, 64, 123, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1671', '1.800', '0.1482', '1.800', '0.0919', '7.000', '0.7078', 1, 1, 1, 1, 1725000921.6614447]
VI_after__Init : ['1.202', '0.1671', '1.800', '0.1485', '1.800', '0.0858', '7.000', '0.7076', 1, 1, 1, 1, 1725000929.7688656]
VI_at__the_End : ['1.202', '0.4191', '1.800', '0.1300', '1.800', '0.1336', '7.000', '0.7087', 1, 1, 1, 1, 1725000993.6778836]