TEST_NAME : Wafer
TEST_DATE : 24_08_30-08_58_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-004-012-05 | FUSED_ID : 6359364768390725829
  IC_TEMP :  -86.01 | VDDM : 1124.55 | AUX_INT :   -7.98 | CsaBias :   37.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.20817e-04 / 2
  ADC_P0  : -7.98201e-03 ± 2.04638e-02
  ADC_P1  : 9.21614e-03 ± 5.38802e-04
  ADC_P2  : -8.04710e-06 ± 2.80623e-06
  CSA_Chi2/NDF : 1.74320e-04 / 2
  CSA_P0  : 5.79569e-02 ± 8.80636e-03
  CSA_P1  : 1.06273e-02 ± 6.63496e-04
  CSA_P2  : -7.12731e-05 ± 1.01043e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [18, 42, 73, 78, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [12, 19, 20, 44, 58, 76]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2561', '1.800', '0.1437', '1.800', '0.1069', '7.000', '0.7087', 1, 1, 1, 1, 1725001114.584381]
VI_after__Init : ['1.202', '0.2563', '1.800', '0.1439', '1.801', '0.0983', '7.000', '0.7081', 1, 1, 1, 1, 1725001122.8297822]
VI_at__the_End : ['1.201', '0.4403', '1.800', '0.1328', '1.799', '0.1277', '7.000', '0.7087', 1, 1, 1, 1, 1725001186.1948445]