TEST_NAME : Wafer
TEST_DATE : 24_08_30-09_01_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-004-014-05 | FUSED_ID : 6359364768390725861
  IC_TEMP :  -97.04 | VDDM : 1125.18 | AUX_INT :  -11.48 | CsaBias :   45.28
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.74288e-03 / 2
  ADC_P0  : -1.14789e-02 ± 2.81636e-02
  ADC_P1  : 9.51472e-03 ± 7.40795e-04
  ADC_P2  : -9.26131e-06 ± 3.87954e-06
  CSA_Chi2/NDF : 1.35600e-04 / 2
  CSA_P0  : 5.83611e-02 ± 7.76697e-03
  CSA_P1  : 1.06089e-02 ± 5.85185e-04
  CSA_P2  : -7.39995e-05 ± 8.91168e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [37, 61, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [0, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2156', '1.800', '0.1501', '1.800', '0.0944', '7.000', '0.7080', 1, 1, 1, 1, 1725001306.1965935]
VI_after__Init : ['1.202', '0.2159', '1.800', '0.1503', '1.800', '0.0887', '7.000', '0.7077', 1, 1, 1, 1, 1725001314.9659085]
VI_at__the_End : ['1.201', '0.4298', '1.800', '0.1328', '1.803', '0.1303', '7.000', '0.7086', 1, 1, 1, 1, 1725001377.9759483]