TEST_NAME : Wafer
TEST_DATE : 24_08_30-09_08_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-004-018-02 | FUSED_ID : 6359364768390725922
  IC_TEMP :  -92.01 | VDDM : 1132.47 | AUX_INT :   -8.07 | CsaBias :   53.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08111e-03 / 2
  ADC_P0  : -8.06550e-03 ± 2.22830e-02
  ADC_P1  : 8.81185e-03 ± 5.82869e-04
  ADC_P2  : -5.84690e-06 ± 3.03197e-06
  CSA_Chi2/NDF : 1.65007e-04 / 2
  CSA_P0  : 5.69061e-02 ± 8.56787e-03
  CSA_P1  : 1.08388e-02 ± 6.45527e-04
  CSA_P2  : -7.64736e-05 ± 9.83062e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [3, 36, 74, 81, 119]
 | N_BROKEN_SLOW :  [28]
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [48, 82, 93]
 | P_BROKEN_SLOW :  [28]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1208', '1.800', '0.1154', '1.800', '0.0929', '7.000', '0.7084', 1, 1, 1, 1, 1725001691.2796926]
VI_after__Init : ['1.202', '0.1208', '1.800', '0.1154', '1.800', '0.0855', '7.000', '0.7076', 1, 1, 1, 1, 1725001699.4300172]
VI_at__the_End : ['1.202', '0.4354', '1.800', '0.1322', '1.799', '0.1298', '7.000', '0.7083', 1, 1, 1, 1, 1725001761.7262447]