TEST_NAME : Wafer
TEST_DATE : 24_08_30-09_11_24
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-004-020-02 | FUSED_ID : 6359364768390725954
  IC_TEMP :  -83.62 | VDDM : 1121.17 | AUX_INT :  -14.96 | CsaBias :   57.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 3.48244e-03 / 2
  ADC_P0  : -1.49641e-02 ± 4.01114e-02
  ADC_P1  : 9.08529e-03 ± 1.02199e-03
  ADC_P2  : -7.28815e-06 ± 5.25447e-06
  CSA_Chi2/NDF : 2.01663e-04 / 2
  CSA_P0  : 5.91117e-02 ± 9.47186e-03
  CSA_P1  : 1.09425e-02 ± 7.13636e-04
  CSA_P2  : -7.53766e-05 ± 1.08678e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [4, 21, 64, 96, 100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [18, 43, 54, 63, 71, 75, 92, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3062', '1.800', '0.1452', '1.800', '0.1038', '7.000', '0.7075', 1, 1, 1, 1, 1725001884.0256767]
VI_after__Init : ['1.201', '0.3063', '1.800', '0.1460', '1.799', '0.0977', '7.000', '0.7074', 1, 1, 1, 1, 1725001892.1231303]
VI_at__the_End : ['1.201', '0.4489', '1.800', '0.1332', '1.801', '0.1262', '7.000', '0.7080', 1, 1, 1, 1, 1725001952.6754189]