TEST_NAME : Wafer
TEST_DATE : 24_08_30-09_49_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-005-005-08 | FUSED_ID : 6359364768390729816
  IC_TEMP :  -78.04 | VDDM : 1122.67 | AUX_INT :   -8.25 | CsaBias :   60.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.27998e-03 / 2
  ADC_P0  : -8.24602e-03 ± 2.42673e-02
  ADC_P1  : 8.69506e-03 ± 6.24733e-04
  ADC_P2  : -5.84374e-06 ± 3.19349e-06
  CSA_Chi2/NDF : 2.25111e-04 / 2
  CSA_P0  : 6.09094e-02 ± 1.00074e-02
  CSA_P1  : 1.04974e-02 ± 7.53984e-04
  CSA_P2  : -6.28547e-05 ± 1.14823e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [41, 98]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [5, 30, 41, 50, 78, 91, 116, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3617', '1.800', '0.1220', '1.799', '0.1035', '7.000', '0.7078', 1, 1, 1, 1, 1725004192.5152318]
VI_after__Init : ['1.202', '0.3622', '1.800', '0.1223', '1.800', '0.0973', '7.000', '0.7075', 1, 1, 1, 1, 1725004201.3177152]
VI_at__the_End : ['1.201', '0.4683', '1.800', '0.1371', '1.800', '0.1253', '7.000', '0.7088', 1, 1, 1, 1, 1725004266.2368088]