TEST_NAME : Wafer
TEST_DATE : 24_08_30-09_45_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-005-008-08 | FUSED_ID : 6359364768390729864
  IC_TEMP :  -73.45 | VDDM : 1121.72 | AUX_INT :  -10.01 | CsaBias :   59.14
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.52721e-03 / 2
  ADC_P0  : -1.00070e-02 ± 2.64278e-02
  ADC_P1  : 8.70068e-03 ± 6.52925e-04
  ADC_P2  : -7.12072e-06 ± 3.20348e-06
  CSA_Chi2/NDF : 1.90647e-04 / 2
  CSA_P0  : 5.66743e-02 ± 9.20952e-03
  CSA_P1  : 1.05369e-02 ± 6.93871e-04
  CSA_P2  : -6.44831e-05 ± 1.05668e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [7, 30, 43, 49, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [3, 10, 11, 30, 57, 72, 88, 102, 115, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3355', '1.800', '0.1452', '1.800', '0.1008', '7.000', '0.7076', 1, 1, 1, 1, 1725003905.0740473]
VI_after__Init : ['1.201', '0.3355', '1.800', '0.1453', '1.800', '0.0948', '7.000', '0.7075', 1, 1, 1, 1, 1725003913.1885314]
VI_at__the_End : ['1.201', '0.4591', '1.800', '0.1340', '1.799', '0.1236', '7.000', '0.7086', 1, 1, 1, 1, 1725003972.6359093]