TEST_NAME : Wafer
TEST_DATE : 24_08_30-09_43_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-005-009-08 | FUSED_ID : 6359364768390729880
  IC_TEMP :  -67.71 | VDDM : 1103.54 | AUX_INT :   -9.75 | CsaBias :   58.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.44364e-03 / 2
  ADC_P0  : -9.74907e-03 ± 2.57309e-02
  ADC_P1  : 8.62733e-03 ± 6.43348e-04
  ADC_P2  : -6.22345e-06 ± 3.20785e-06
  CSA_Chi2/NDF : 1.98349e-04 / 2
  CSA_P0  : 5.79586e-02 ± 9.39371e-03
  CSA_P1  : 1.02501e-02 ± 7.07748e-04
  CSA_P2  : -5.83425e-05 ± 1.07782e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [6, 23, 47, 64, 73, 107, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [0, 23, 71, 72, 89]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2734', '1.800', '0.1627', '1.800', '0.0935', '7.000', '0.7086', 1, 1, 1, 1, 1725003808.2846975]
VI_after__Init : ['1.202', '0.2740', '1.800', '0.1630', '1.800', '0.0851', '7.000', '0.7076', 1, 1, 1, 1, 1725003816.2489579]
VI_at__the_End : ['1.201', '0.4674', '1.800', '0.1364', '1.800', '0.1221', '7.000', '0.7083', 1, 1, 1, 1, 1725003877.9252498]