TEST_NAME : Wafer
TEST_DATE : 24_08_30-09_41_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-005-010-08 | FUSED_ID : 6359364768390729896
  IC_TEMP :  -77.56 | VDDM : 1119.49 | AUX_INT :  -10.44 | CsaBias :   51.46
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.75740e-03 / 2
  ADC_P0  : -1.04416e-02 ± 2.84127e-02
  ADC_P1  : 8.89213e-03 ± 7.25850e-04
  ADC_P2  : -6.92644e-06 ± 3.69201e-06
  CSA_Chi2/NDF : 1.73610e-04 / 2
  CSA_P0  : 5.86666e-02 ± 8.78841e-03
  CSA_P1  : 1.05708e-02 ± 6.62143e-04
  CSA_P2  : -6.67929e-05 ± 1.00837e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [34, 46, 74, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [12, 14, 32, 34, 41, 54, 60, 70, 87, 99, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0817', '1.800', '0.1446', '1.800', '0.0857', '7.000', '0.7075', 1, 1, 1, 1, 1725003711.6431725]
VI_after__Init : ['1.201', '0.0816', '1.800', '0.1446', '1.799', '0.0803', '7.000', '0.7073', 1, 1, 1, 1, 1725003720.39335]
VI_at__the_End : ['1.202', '0.4531', '1.800', '0.1342', '1.800', '0.1247', '7.000', '0.7083', 1, 1, 1, 1, 1725003777.0190556]