TEST_NAME : Wafer
TEST_DATE : 24_08_30-09_40_16
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-005-011-08 | FUSED_ID : 6359364768390729912
  IC_TEMP :  -77.21 | VDDM : 1128.58 | AUX_INT :  -10.31 | CsaBias :   53.83
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.48946e-03 / 2
  ADC_P0  : -1.03079e-02 ± 2.60707e-02
  ADC_P1  : 9.21930e-03 ± 6.78706e-04
  ADC_P2  : -8.09970e-06 ± 3.51433e-06
  CSA_Chi2/NDF : 1.95004e-04 / 2
  CSA_P0  : 6.06967e-02 ± 9.31418e-03
  CSA_P1  : 1.02868e-02 ± 7.01756e-04
  CSA_P2  : -6.10862e-05 ± 1.06869e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [36, 58]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [7, 9, 21, 38, 63, 66, 68, 89, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3203', '1.800', '0.1354', '1.800', '0.1003', '7.000', '0.7072', 1, 1, 1, 1, 1725003615.8966212]
VI_after__Init : ['1.202', '0.3206', '1.800', '0.1356', '1.800', '0.0940', '7.000', '0.7072', 1, 1, 1, 1, 1725003624.0528586]
VI_at__the_End : ['1.202', '0.4588', '1.800', '0.1389', '1.805', '0.1241', '7.000', '0.7083', 1, 1, 1, 1, 1725003684.4691703]