TEST_NAME : Wafer
TEST_DATE : 24_08_30-09_37_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-005-013-08 | FUSED_ID : 6359364768390729944
  IC_TEMP :  -65.77 | VDDM : 1107.57 | AUX_INT :   -9.84 | CsaBias :   67.70
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.63486e-03 / 2
  ADC_P0  : -9.83610e-03 ± 2.74154e-02
  ADC_P1  : 8.67231e-03 ± 6.89458e-04
  ADC_P2  : -6.33706e-06 ± 3.45109e-06
  CSA_Chi2/NDF : 1.96935e-04 / 2
  CSA_P0  : 5.89185e-02 ± 9.36018e-03
  CSA_P1  : 1.02928e-02 ± 7.05222e-04
  CSA_P2  : -5.84075e-05 ± 1.07397e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [9, 59, 72, 75, 96]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [15, 59, 68, 93, 95, 100]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2561', '1.800', '0.1317', '1.800', '0.0912', '7.000', '0.7073', 1, 1, 1, 1, 1725003422.7825527]
VI_after__Init : ['1.201', '0.2561', '1.800', '0.1316', '1.800', '0.0852', '7.000', '0.7075', 1, 1, 1, 1, 1725003430.8789053]
VI_at__the_End : ['1.202', '0.4707', '1.800', '0.1353', '1.800', '0.1195', '7.000', '0.7083', 1, 1, 1, 1, 1725003491.151281]