TEST_NAME : Wafer
TEST_DATE : 24_08_30-09_29_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-005-018-15 | FUSED_ID : 6359364768390730031
  IC_TEMP :  -93.38 | VDDM : 1113.13 | AUX_INT :  -12.19 | CsaBias :   43.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.02347e-03 / 2
  ADC_P0  : -1.21939e-02 ± 3.04083e-02
  ADC_P1  : 9.34436e-03 ± 7.95170e-04
  ADC_P2  : -8.25060e-06 ± 4.16547e-06
  CSA_Chi2/NDF : 1.59629e-04 / 2
  CSA_P0  : 5.77780e-02 ± 8.42711e-03
  CSA_P1  : 1.01975e-02 ± 6.34922e-04
  CSA_P2  : -7.03419e-05 ± 9.66911e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [1, 43, 63, 76, 77, 85, 99, 103, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [26, 27, 41, 45, 49, 84, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1673', '1.800', '0.1529', '1.799', '0.0960', '7.000', '0.7069', 1, 1, 1, 1, 1725002941.5418458]
VI_after__Init : ['1.201', '0.1674', '1.800', '0.1532', '1.800', '0.0900', '7.000', '0.7069', 1, 1, 1, 1, 1725002950.3191423]
VI_at__the_End : ['1.201', '0.4183', '1.800', '0.1324', '1.803', '0.1290', '7.000', '0.7077', 1, 1, 1, 1, 1725003011.454426]