TEST_NAME : Wafer
TEST_DATE : 24_08_30-09_27_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-005-019-15 | FUSED_ID : 6359364768390730047
  IC_TEMP :  -82.75 | VDDM : 1124.42 | AUX_INT :   -9.96 | CsaBias :   43.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.54109e-03 / 2
  ADC_P0  : -9.95830e-03 ± 2.65743e-02
  ADC_P1  : 9.02076e-03 ± 6.87267e-04
  ADC_P2  : -7.26899e-06 ± 3.53583e-06
  CSA_Chi2/NDF : 1.47585e-04 / 2
  CSA_P0  : 5.76263e-02 ± 8.10296e-03
  CSA_P1  : 1.04773e-02 ± 6.10500e-04
  CSA_P2  : -6.78699e-05 ± 9.29719e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [54, 96, 99, 110, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [1, 3, 11, 55, 84, 87, 106, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2390', '1.800', '0.1578', '1.800', '0.1023', '7.000', '0.7077', 1, 1, 1, 1, 1725002845.4732206]
VI_after__Init : ['1.201', '0.2393', '1.800', '0.1582', '1.800', '0.0947', '7.000', '0.7068', 1, 1, 1, 1, 1725002853.6966403]
VI_at__the_End : ['1.201', '0.4450', '1.800', '0.1351', '1.800', '0.1244', '7.000', '0.7076', 1, 1, 1, 1, 1725002915.7858398]