TEST_NAME : Wafer
TEST_DATE : 24_08_30-09_21_01
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-005-023-15 | FUSED_ID : 6359364768390730111
  IC_TEMP :  -67.93 | VDDM : 1117.50 | AUX_INT :  -39.61 | CsaBias :   40.67
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.54373e-03 / 2
  ADC_P0  : -3.96086e-02 ± 3.61504e-02
  ADC_P1  : 8.98829e-03 ± 8.81467e-04
  ADC_P2  : -7.59715e-06 ± 4.28713e-06
  CSA_Chi2/NDF : 2.32031e-04 / 2
  CSA_P0  : 5.56811e-02 ± 1.01600e-02
  CSA_P1  : 1.01290e-02 ± 7.65486e-04
  CSA_P2  : -5.87470e-05 ± 1.16574e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [26, 70, 76, 102]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [0, 4, 34, 37, 52, 81, 90, 113, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4245', '1.800', '0.1607', '1.800', '0.1081', '7.000', '0.7069', 1, 1, 1, 1, 1725002461.2950826]
VI_after__Init : ['1.201', '0.4261', '1.800', '0.1619', '1.800', '0.1020', '7.000', '0.7069', 1, 1, 1, 1, 1725002469.3963764]
VI_at__the_End : ['1.201', '0.4569', '1.800', '0.1321', '1.800', '0.1229', '7.000', '0.7076', 1, 1, 1, 1, 1725002531.996564]