TEST_NAME : Wafer
TEST_DATE : 24_08_30-09_54_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-006-004-06 | FUSED_ID : 6359364768390733894
  IC_TEMP :  -58.60 | VDDM : 1117.27 | AUX_INT :   -8.55 | CsaBias :   65.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21515e-03 / 2
  ADC_P0  : -8.54755e-03 ± 2.36189e-02
  ADC_P1  : 8.22964e-03 ± 5.71021e-04
  ADC_P2  : -5.41393e-06 ± 2.74448e-06
  CSA_Chi2/NDF : 1.69160e-04 / 2
  CSA_P0  : 5.71214e-02 ± 8.67502e-03
  CSA_P1  : 9.79833e-03 ± 6.53601e-04
  CSA_P2  : -4.69007e-05 ± 9.95356e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [10, 22, 45, 53, 54, 75, 90, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [14, 38, 58, 69, 78, 85, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2651', '1.800', '0.1371', '1.799', '0.0983', '7.000', '0.7083', 1, 1, 1, 1, 1725004469.1680534]
VI_after__Init : ['1.201', '0.2651', '1.800', '0.1372', '1.800', '0.0912', '7.000', '0.7075', 1, 1, 1, 1, 1725004477.3415425]
VI_at__the_End : ['1.201', '0.4834', '1.800', '0.1370', '1.800', '0.1152', '7.000', '0.7087', 1, 1, 1, 1, 1725004545.2920241]