TEST_NAME : Wafer
TEST_DATE : 24_08_30-09_57_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-006-006-06 | FUSED_ID : 6359364768390733926
  IC_TEMP :  -66.51 | VDDM : 1118.22 | AUX_INT :   -7.90 | CsaBias :   59.70
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.20678e-03 / 2
  ADC_P0  : -7.89501e-03 ± 2.35723e-02
  ADC_P1  : 8.49244e-03 ± 5.97318e-04
  ADC_P2  : -5.33805e-06 ± 3.00436e-06
  CSA_Chi2/NDF : 1.77950e-04 / 2
  CSA_P0  : 5.81605e-02 ± 8.89757e-03
  CSA_P1  : 1.01597e-02 ± 6.70368e-04
  CSA_P2  : -5.53816e-05 ± 1.02089e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [48, 63, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [28, 40, 45, 68, 69, 87, 94, 108, 110, 121, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3564', '1.800', '0.1755', '1.799', '0.1061', '7.000', '0.7082', 1, 1, 1, 1, 1725004661.4410393]
VI_after__Init : ['1.201', '0.3569', '1.800', '0.1757', '1.800', '0.1002', '7.000', '0.7078', 1, 1, 1, 1, 1725004670.2135932]
VI_at__the_End : ['1.201', '0.4716', '1.800', '0.1373', '1.803', '0.1216', '7.000', '0.7086', 1, 1, 1, 1, 1725004729.6265278]