TEST_NAME : Wafer
TEST_DATE : 24_08_30-09_59_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-006-007-06 | FUSED_ID : 6359364768390733942
  IC_TEMP :  -70.76 | VDDM : 1126.81 | AUX_INT :   -8.41 | CsaBias :   59.32
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.20692e-03 / 2
  ADC_P0  : -8.40798e-03 ± 2.35630e-02
  ADC_P1  : 8.50914e-03 ± 5.95784e-04
  ADC_P2  : -5.35093e-06 ± 2.99963e-06
  CSA_Chi2/NDF : 1.84332e-04 / 2
  CSA_P0  : 6.02799e-02 ± 9.05571e-03
  CSA_P1  : 1.04496e-02 ± 6.82282e-04
  CSA_P2  : -6.07287e-05 ± 1.03903e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [0, 22, 36, 37, 44, 45, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [4, 24, 46, 72, 79, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2893', '1.800', '0.1865', '1.800', '0.0936', '7.000', '0.7080', 1, 1, 1, 1, 1725004758.0025702]
VI_after__Init : ['1.201', '0.2895', '1.800', '0.1867', '1.800', '0.0876', '7.000', '0.7079', 1, 1, 1, 1, 1725004766.0130038]
VI_at__the_End : ['1.201', '0.4717', '1.800', '0.1374', '1.803', '0.1210', '7.000', '0.7086', 1, 1, 1, 1, 1725004833.5623038]