TEST_NAME : Wafer
TEST_DATE : 24_08_30-10_00_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-006-008-06 | FUSED_ID : 6359364768390733958
  IC_TEMP :  -71.11 | VDDM : 1118.12 | AUX_INT :  -10.08 | CsaBias :   51.54
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53788e-03 / 2
  ADC_P0  : -1.00751e-02 ± 2.65374e-02
  ADC_P1  : 8.85232e-03 ± 6.71708e-04
  ADC_P2  : -7.06683e-06 ± 3.38352e-06
  CSA_Chi2/NDF : 1.92935e-04 / 2
  CSA_P0  : 5.62279e-02 ± 9.26462e-03
  CSA_P1  : 1.06270e-02 ± 6.98022e-04
  CSA_P2  : -6.55683e-05 ± 1.06301e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [27, 64]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [13, 17, 27, 34, 35, 37, 40, 59, 66, 105, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3200', '1.800', '0.1488', '1.800', '0.0923', '7.000', '0.7090', 1, 1, 1, 1, 1725004853.7608304]
VI_after__Init : ['1.201', '0.3201', '1.800', '0.1494', '1.800', '0.0845', '7.000', '0.7076', 1, 1, 1, 1, 1725004861.847326]
VI_at__the_End : ['1.201', '0.4613', '1.800', '0.1378', '1.800', '0.1227', '7.000', '0.7083', 1, 1, 1, 1, 1725004929.2044716]