TEST_NAME : Wafer
TEST_DATE : 24_08_30-10_02_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-006-009-06 | FUSED_ID : 6359364768390733974
  IC_TEMP :  -75.16 | VDDM : 1119.22 | AUX_INT :  -11.23 | CsaBias :   57.36
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.18391e-03 / 2
  ADC_P0  : -1.12329e-02 ± 3.17560e-02
  ADC_P1  : 8.62167e-03 ± 7.94508e-04
  ADC_P2  : -6.01959e-06 ± 3.97444e-06
  CSA_Chi2/NDF : 1.82319e-04 / 2
  CSA_P0  : 5.94359e-02 ± 9.00614e-03
  CSA_P1  : 1.04301e-02 ± 6.78548e-04
  CSA_P2  : -6.53082e-05 ± 1.03335e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [8, 20, 38, 42, 49, 59, 85, 101, 115, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [38, 53, 59]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1583', '1.800', '0.1544', '1.800', '0.0922', '7.000', '0.7076', 1, 1, 1, 1, 1725004950.608908]
VI_after__Init : ['1.201', '0.1583', '1.800', '0.1544', '1.800', '0.0865', '7.000', '0.7075', 1, 1, 1, 1, 1725004958.6823015]
VI_at__the_End : ['1.201', '0.4513', '1.800', '0.1340', '1.800', '0.1228', '7.000', '0.7085', 1, 1, 1, 1, 1725005023.3687325]