TEST_NAME : Wafer
TEST_DATE : 24_08_30-10_04_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-006-010-06 | FUSED_ID : 6359364768390733990
  IC_TEMP :  -65.77 | VDDM : 1100.42 | AUX_INT :   -7.58 | CsaBias :   61.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.94791e-04 / 2
  ADC_P0  : -7.58354e-03 ± 2.02263e-02
  ADC_P1  : 8.64132e-03 ± 5.11236e-04
  ADC_P2  : -6.24482e-06 ± 2.56324e-06
  CSA_Chi2/NDF : 1.83391e-04 / 2
  CSA_P0  : 5.94882e-02 ± 9.03257e-03
  CSA_P1  : 1.01557e-02 ± 6.80539e-04
  CSA_P2  : -5.58584e-05 ± 1.03638e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [10, 21, 29, 86, 95, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [27, 44, 56, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3649', '1.800', '0.1787', '1.800', '0.0989', '7.000', '0.7077', 1, 1, 1, 1, 1725005047.1329389]
VI_after__Init : ['1.201', '0.3652', '1.800', '0.1788', '1.800', '0.0933', '7.000', '0.7076', 1, 1, 1, 1, 1725005055.185426]
VI_at__the_End : ['1.201', '0.4750', '1.800', '0.1381', '1.800', '0.1195', '7.000', '0.7083', 1, 1, 1, 1, 1725005115.5351257]