TEST_NAME : Wafer
TEST_DATE : 24_08_30-10_08_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-006-013-06 | FUSED_ID : 6359364768390734038
  IC_TEMP :  -59.93 | VDDM : 1126.01 | AUX_INT :   -7.19 | CsaBias :   74.95
  CONF_FAIL_REG : 1
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.52267e-04 / 2
  ADC_P0  : -7.19171e-03 ± 2.09159e-02
  ADC_P1  : 8.26496e-03 ± 5.17211e-04
  ADC_P2  : -5.03499e-06 ± 2.53643e-06
  CSA_Chi2/NDF : 1.33003e-04 / 2
  CSA_P0  : 5.98975e-02 ± 7.69225e-03
  CSA_P1  : 9.64915e-03 ± 5.79556e-04
  CSA_P2  : -4.79282e-05 ± 8.82595e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [6, 26, 27, 38, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [58, 77, 84, 104, 105, 111, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.4392', '1.800', '0.1396', '1.800', '0.0945', '7.000', '0.7074', 1, 1, 1, 1, 1725005334.6422403]
VI_after__Init : ['1.201', '0.4390', '1.800', '0.1397', '1.800', '0.0887', '7.000', '0.7075', 1, 1, 1, 1, 1725005342.721615]
VI_at__the_End : ['1.201', '0.4720', '1.800', '0.1349', '1.800', '0.1167', '7.000', '0.7079', 1, 1, 1, 1, 1725005410.546747]