TEST_NAME : Wafer
TEST_DATE : 24_08_30-10_10_31
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-006-014-06 | FUSED_ID : 6359364768390734054
  IC_TEMP :  -60.97 | VDDM : 1120.17 | AUX_INT :   -9.25 | CsaBias :   70.21
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43243e-03 / 2
  ADC_P0  : -9.25429e-03 ± 2.56634e-02
  ADC_P1  : 7.99781e-03 ± 6.01273e-04
  ADC_P2  : -5.12098e-06 ± 2.80394e-06
  CSA_Chi2/NDF : 1.34229e-04 / 2
  CSA_P0  : 5.93497e-02 ± 7.72762e-03
  CSA_P1  : 9.51128e-03 ± 5.82220e-04
  CSA_P2  : -4.83705e-05 ± 8.86653e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [22, 60, 79, 102, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [36, 58, 64, 89, 112, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2705', '1.800', '0.1497', '1.800', '0.0946', '7.000', '0.7072', 1, 1, 1, 1, 1725005431.36616]
VI_after__Init : ['1.202', '0.2708', '1.800', '0.1499', '1.800', '0.0884', '7.000', '0.7074', 1, 1, 1, 1, 1725005439.4315681]
VI_at__the_End : ['1.201', '0.4609', '1.800', '0.1332', '1.802', '0.1202', '7.000', '0.7078', 1, 1, 1, 1, 1725005499.6970713]