TEST_NAME : Wafer
TEST_DATE : 24_08_30-10_12_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-006-015-06 | FUSED_ID : 6359364768390734070
  IC_TEMP :  -64.85 | VDDM : 1128.58 | AUX_INT :   -8.13 | CsaBias :   60.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00815e-03 / 2
  ADC_P0  : -8.13262e-03 ± 2.14453e-02
  ADC_P1  : 8.69351e-03 ± 5.37243e-04
  ADC_P2  : -6.84471e-06 ± 2.66540e-06
  CSA_Chi2/NDF : 1.53949e-04 / 2
  CSA_P0  : 6.03581e-02 ± 8.27582e-03
  CSA_P1  : 1.04378e-02 ± 6.23524e-04
  CSA_P2  : -5.86918e-05 ± 9.49553e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [4, 31, 35, 80, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [1, 18, 22, 55, 76, 112, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4023', '1.800', '0.1569', '1.800', '0.1018', '7.000', '0.7072', 1, 1, 1, 1, 1725005528.1589947]
VI_after__Init : ['1.201', '0.4029', '1.800', '0.1571', '1.800', '0.0960', '7.000', '0.7071', 1, 1, 1, 1, 1725005536.2315187]
VI_at__the_End : ['1.201', '0.4807', '1.800', '0.1368', '1.800', '0.1197', '7.000', '0.7078', 1, 1, 1, 1, 1725005599.8648336]