TEST_NAME : Wafer
TEST_DATE : 24_08_30-10_13_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-006-016-01 | FUSED_ID : 6359364768390734081
  IC_TEMP :  -70.19 | VDDM : 1130.05 | AUX_INT :   -8.39 | CsaBias :   68.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26642e-03 / 2
  ADC_P0  : -8.38608e-03 ± 2.41293e-02
  ADC_P1  : 8.53867e-03 ± 6.08045e-04
  ADC_P2  : -5.71988e-06 ± 3.04371e-06
  CSA_Chi2/NDF : 1.58217e-04 / 2
  CSA_P0  : 5.97217e-02 ± 8.38975e-03
  CSA_P1  : 1.03961e-02 ± 6.32107e-04
  CSA_P2  : -6.07556e-05 ± 9.62625e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [1, 44, 49, 58, 74, 94, 106, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [1, 17, 22, 25, 40, 70, 89, 91]
 | P_BROKEN_SLOW :  [64]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2324', '1.800', '0.1445', '1.799', '0.0967', '7.000', '0.7079', 1, 1, 1, 1, 1725005624.4439187]
VI_after__Init : ['1.201', '0.2324', '1.800', '0.1446', '1.800', '0.0890', '7.000', '0.7070', 1, 1, 1, 1, 1725005632.5653317]
VI_at__the_End : ['1.201', '0.4693', '1.800', '0.1380', '1.801', '0.1201', '7.000', '0.7079', 1, 1, 1, 1, 1725005699.3604956]