TEST_NAME : Wafer
TEST_DATE : 24_08_30-10_15_20
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-006-017-01 | FUSED_ID : 6359364768390734097
  IC_TEMP :  -69.27 | VDDM : 1122.56 | AUX_INT :  -11.44 | CsaBias :   58.45
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.04060e-03 / 2
  ADC_P0  : -1.14430e-02 ± 3.06387e-02
  ADC_P1  : 8.78951e-03 ± 7.71491e-04
  ADC_P2  : -6.68113e-06 ± 3.88359e-06
  CSA_Chi2/NDF : 1.68579e-04 / 2
  CSA_P0  : 5.94843e-02 ± 8.66011e-03
  CSA_P1  : 1.04674e-02 ± 6.52477e-04
  CSA_P2  : -6.16622e-05 ± 9.93645e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [11, 25, 26, 36, 46, 80, 84, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [31, 75, 98, 100, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1715', '1.799', '0.1545', '1.800', '0.0870', '7.000', '0.7071', 1, 1, 1, 1, 1725005720.1489296]
VI_after__Init : ['1.201', '0.1715', '1.800', '0.1545', '1.800', '0.0812', '7.000', '0.7072', 1, 1, 1, 1, 1725005728.8732977]
VI_at__the_End : ['1.201', '0.4697', '1.800', '0.1378', '1.800', '0.1210', '7.000', '0.7077', 1, 1, 1, 1, 1725005794.6114283]