TEST_NAME : Wafer
TEST_DATE : 24_08_30-10_16_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-006-018-01 | FUSED_ID : 6359364768390734113
  IC_TEMP :  -70.93 | VDDM : 1126.45 | AUX_INT :   -9.46 | CsaBias :   60.51
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43801e-03 / 2
  ADC_P0  : -9.46295e-03 ± 2.56814e-02
  ADC_P1  : 8.80029e-03 ± 6.53714e-04
  ADC_P2  : -6.66502e-06 ± 3.30909e-06
  CSA_Chi2/NDF : 1.82593e-04 / 2
  CSA_P0  : 5.98646e-02 ± 9.01290e-03
  CSA_P1  : 1.05752e-02 ± 6.79057e-04
  CSA_P2  : -6.36268e-05 ± 1.03412e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [14, 66, 95, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [14, 20, 21, 38, 104, 112, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1636', '1.800', '0.1283', '1.800', '0.0856', '7.000', '0.7071', 1, 1, 1, 1, 1725005816.9688003]
VI_after__Init : ['1.201', '0.1636', '1.800', '0.1283', '1.800', '0.0799', '7.000', '0.7072', 1, 1, 1, 1, 1725005825.1171322]
VI_at__the_End : ['1.201', '0.4672', '1.800', '0.1380', '1.800', '0.1215', '7.000', '0.7075', 1, 1, 1, 1, 1725005885.553602]