TEST_NAME : Wafer
TEST_DATE : 24_08_30-10_20_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-006-020-01 | FUSED_ID : 6359364768390734145
  IC_TEMP :  -68.94 | VDDM : 1118.42 | AUX_INT :  -10.94 | CsaBias :   65.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.93318e-03 / 2
  ADC_P0  : -1.09407e-02 ± 2.98328e-02
  ADC_P1  : 8.58434e-03 ± 7.39674e-04
  ADC_P2  : -6.13348e-06 ± 3.66485e-06
  CSA_Chi2/NDF : 2.01415e-04 / 2
  CSA_P0  : 5.82936e-02 ± 9.46603e-03
  CSA_P1  : 1.02121e-02 ± 7.13197e-04
  CSA_P2  : -6.01349e-05 ± 1.08612e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [12, 16, 35, 54, 65, 100, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [7, 22, 47, 74, 100, 101, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1154', '1.800', '0.1831', '1.799', '0.0849', '7.000', '0.7069', 1, 1, 1, 1, 1725006009.5144558]
VI_after__Init : ['1.202', '0.1153', '1.800', '0.1829', '1.800', '0.0792', '7.000', '0.7069', 1, 1, 1, 1, 1725006018.2298844]
VI_at__the_End : ['1.201', '0.4603', '1.800', '0.1325', '1.800', '0.1233', '7.000', '0.7076', 1, 1, 1, 1, 1725006077.2493987]