TEST_NAME : Wafer
TEST_DATE : 24_08_30-10_21_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-006-021-01 | FUSED_ID : 6359364768390734161
  IC_TEMP :  -65.75 | VDDM : 1104.48 | AUX_INT :   -9.85 | CsaBias :   74.29
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.70822e-03 / 2
  ADC_P0  : -9.85124e-03 ± 2.80941e-02
  ADC_P1  : 8.46437e-03 ± 7.06656e-04
  ADC_P2  : -5.04148e-06 ± 3.55566e-06
  CSA_Chi2/NDF : 1.77693e-04 / 2
  CSA_P0  : 5.86539e-02 ± 8.89114e-03
  CSA_P1  : 1.02707e-02 ± 6.69883e-04
  CSA_P2  : -5.78979e-05 ± 1.02015e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [31, 40, 54, 57, 80, 92, 100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [3, 8, 47, 59, 90, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1864', '1.800', '0.1634', '1.800', '0.0887', '7.000', '0.7069', 1, 1, 1, 1, 1725006104.9523427]
VI_after__Init : ['1.201', '0.1866', '1.800', '0.1634', '1.800', '0.0828', '7.000', '0.7069', 1, 1, 1, 1, 1725006113.8117616]
VI_at__the_End : ['1.201', '0.4714', '1.800', '0.1352', '1.803', '0.1200', '7.000', '0.7073', 1, 1, 1, 1, 1725006179.469836]