TEST_NAME : Wafer
TEST_DATE : 24_08_30-10_24_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-006-023-01 | FUSED_ID : 6359364768390734193
  IC_TEMP :  -64.06 | VDDM : 1123.99 | AUX_INT :   -9.75 | CsaBias :   58.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.44364e-03 / 2
  ADC_P0  : -9.74907e-03 ± 2.57309e-02
  ADC_P1  : 8.62733e-03 ± 6.43348e-04
  ADC_P2  : -6.22345e-06 ± 3.20785e-06
  CSA_Chi2/NDF : 1.63747e-04 / 2
  CSA_P0  : 5.71079e-02 ± 8.53510e-03
  CSA_P1  : 1.02056e-02 ± 6.43058e-04
  CSA_P2  : -5.51880e-05 ± 9.79301e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [7, 12, 15, 37, 80, 82, 89, 100, 113, 117, 123, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [51, 54, 56, 81, 86, 92, 95, 101, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3005', '1.800', '0.1396', '1.800', '0.0885', '7.000', '0.7069', 1, 1, 1, 1, 1725006297.9944232]
VI_after__Init : ['1.201', '0.3008', '1.800', '0.1396', '1.799', '0.0830', '7.000', '0.7067', 1, 1, 1, 1, 1725006306.0977995]
VI_at__the_End : ['1.201', '0.4771', '1.800', '0.1346', '1.799', '0.1200', '7.000', '0.7078', 1, 1, 1, 1, 1725006373.532288]