TEST_NAME : Wafer
TEST_DATE : 24_08_30-10_26_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-006-024-01 | FUSED_ID : 6359364768390734209
  IC_TEMP :  -63.07 | VDDM : 1119.77 | AUX_INT :   -7.40 | CsaBias :   60.01
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04384e-03 / 2
  ADC_P0  : -7.39830e-03 ± 2.18827e-02
  ADC_P1  : 8.47289e-03 ± 5.47683e-04
  ADC_P2  : -5.78981e-06 ± 2.71299e-06
  CSA_Chi2/NDF : 1.85693e-04 / 2
  CSA_P0  : 5.81190e-02 ± 9.08909e-03
  CSA_P1  : 1.01216e-02 ± 6.84798e-04
  CSA_P2  : -5.46172e-05 ± 1.04287e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [52, 57, 63, 69, 92, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [7, 47, 66, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3218', '1.800', '0.1480', '1.800', '0.0995', '7.000', '0.7070', 1, 1, 1, 1, 1725006392.9766946]
VI_after__Init : ['1.201', '0.3222', '1.800', '0.1481', '1.800', '0.0936', '7.000', '0.7069', 1, 1, 1, 1, 1725006401.7299771]
VI_at__the_End : ['1.201', '0.4731', '1.800', '0.1344', '1.802', '0.1198', '7.000', '0.7079', 1, 1, 1, 1, 1725006462.9479682]