TEST_NAME : Wafer
TEST_DATE : 24_08_30-11_04_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-007-005-11 | FUSED_ID : 6359364768390738011
  IC_TEMP :  -62.96 | VDDM : 1122.55 | AUX_INT :   -9.22 | CsaBias :   66.27
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35287e-03 / 2
  ADC_P0  : -9.22262e-03 ± 2.49113e-02
  ADC_P1  : 8.44208e-03 ± 6.11407e-04
  ADC_P2  : -5.97942e-06 ± 2.98423e-06
  CSA_Chi2/NDF : 2.07026e-04 / 2
  CSA_P0  : 5.97573e-02 ± 9.59699e-03
  CSA_P1  : 1.02728e-02 ± 7.23064e-04
  CSA_P2  : -5.62776e-05 ± 1.10114e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [8, 23, 25, 41, 53, 64, 66, 96, 109, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [25, 81, 94, 100, 106, 118, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3356', '1.800', '0.1537', '1.800', '0.0929', '7.000', '0.7073', 1, 1, 1, 1, 1725008695.582127]
VI_after__Init : ['1.202', '0.3360', '1.800', '0.1537', '1.799', '0.0873', '7.000', '0.7072', 1, 1, 1, 1, 1725008703.7717032]
VI_at__the_End : ['1.201', '0.4809', '1.800', '0.1393', '1.808', '0.1182', '7.000', '0.7082', 1, 1, 1, 1, 1725008771.4743733]